Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution / Tien T. Tsong.

Material type: Text

TextPublisher: Cambridge ; Cambridge University Press, 1990Description: x, 387 p.ISBN: 0521363799.Subject(s): Atom-probe field ion microscopyDDC classification: 502.82

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Book	Dr. B. R. Ambedkar Central Library Science	Science Collections	502.82 T7892 At (Browse shelf(Opens below))	Available		175742

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