Pattern recognition and machine learning :  proceedings of the Japan-U.S. seminar on the learning process in control systems, held in Nagoya, August 18-20, 1970 / 
edited by K. S. Fu. 
 - New York :  Plenum Press,  1971. 
 - ix, 343 p. : 
<br/><br/><label>ISBN: </label>0306305461 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Pattern recognition systems.
<br/><br/><label>Dewey Class. No.: </label>621.399  / Pa