TY  - BOOK
AU  - Bowkett, K. M.
TI  - Field-ion microscopy
T2  - Defects in crystalline solids
SN  - 072041752X
U1  - 548.83 
PY  - 1970///
CY  - Amsterdam
PB  - North-Holland Pub.
KW  - Field ion microscopy
N1  - 0
ER  -