Tsong, Tien Tsou, <br/><br/>
Atom-probe field ion microscopy :  field ion emission and surfaces and interfaces at atomic resolution / 
Tien T. Tsong. 
 - Cambridge ;  Cambridge University Press,  1990. 
 - x, 387 p. : 
<br/><br/><label>ISBN: </label>0521363799 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atom-probe field ion microscopy.
<br/><br/><label>Dewey Class. No.: </label>502.82  / At