TY  - BOOK
TI  - Point and extended defects in semiconductors
SN  - 0306433367
U1  - 621.38152 
PY  - 1989///
CY  - New York
PB  - Plenum Press
KW  - Semiconductors
N1  - "Proceedings of the NATO advanced research workshop/International School of Materials Science and Technology, Second Workshop on Point, Extended, and Surface Defects in Semiconductors, held November 2-7, 1988 in Erice, Italy"--T.p. verso
ER  -