Ion beam surface layer analysis / edited by O. Meyer, G. Linker and F. Kappeler.

Material type: Text

TextPublisher: New York : Plenum Press, c1976Description: 2 v.ISBN: 0306350459.Subject(s): Thin films, Effect of radiation onDDC classification: 530.4175

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Book	Dr. B. R. Ambedkar Central Library Science	530.4175 In828 Io (Browse shelf(Opens below))	Available		80724
Book	Dr. B. R. Ambedkar Central Library Science	530.4175 In828 Io (Browse shelf(Opens below))	Available		80725

"Proceedings of the International Conference on Ion Beam Surface Layer Analysis held at Karlsruhe, Ger., Sept. 15-19, 1975"--Preface

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