Pattern recognition and machine learning : proceedings of the Japan-U.S. seminar on the learning process in control systems, held in Nagoya, August 18-20, 1970 / edited by K. S. Fu.

Material type: Text

TextPublisher: New York : Plenum Press, 1971Description: ix, 343 p.ISBN: 0306305461.Subject(s): Pattern recognition systemsDDC classification: 621.399

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Book	Dr. B. R. Ambedkar Central Library Science	621.399 J2715 Pa (Browse shelf(Opens below))	Available		84579

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