Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution / Tien T. Tsong.
By: Tsong, Tien Tsou.
Material type: TextPublisher: Cambridge ; Cambridge University Press, 1990Description: x, 387 p.ISBN: 0521363799.Subject(s): Atom-probe field ion microscopyDDC classification: 502.82Item type | Current library | Collection | Call number | Status | Date due | Barcode |
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Book | Dr. B. R. Ambedkar Central Library Science | Science Collections | 502.82 T7892 At (Browse shelf(Opens below)) | Available | 175742 |
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502.82 B4699 Ap-XIII Applied scanning probe methods XIII : | 502.82 L819 Ha Handbook of microscopy / | 502.82 N2141 Op Optics at the nanometer scale : imaging and storing with photonic near fields / | 502.82 T7892 At Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution / | 502.825 B9821 Dy Dynamic experiments in the electron microscope / | 502.825 F9599 Tr Transmission electron microscopy and diffractometry of materials / | 502.825 G467 Pr Practical methods in electron microscopy / |
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