Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution / Tien T. Tsong.
By: Tsong, Tien Tsou.
Material type: TextPublisher: Cambridge ; Cambridge University Press, 1990Description: x, 387 p.ISBN: 0521363799.Subject(s): Atom-probe field ion microscopyDDC classification: 502.82No physical items for this record
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