Point and extended defects in semiconductors / edited by G. Benedek, A. Cavallini and W. Schroter.
Material type:
TextPublisher: New York : Plenum Press, c1989Description: x, 287 p.ISBN: 0306433367.Subject(s): SemiconductorsDDC classification: 621.38152
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Book | Dr. B. R. Ambedkar Central Library Science | 621.38152 W89284 Po (Browse shelf(Opens below)) | Available | 153752 |
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| 621.38152 W2469 Se Self-assembled quantum dots | 621.38152 W538 Me Metal based thin films for electronics / | 621.38152 W6732 Io Ion implantation and beam processing / | 621.38152 W89284 Po Point and extended defects in semiconductors / | 621.38152 Z8 Fu Functional thin films and nanostructures for sensors : | 621.381522 R8121 Tu Tunnelling and negative resistance phenomena in semiconductors / | 621.381522 Se5218 Se,40 Semiconductor diodes. |
"Proceedings of the NATO advanced research workshop/International School of Materials Science and Technology, Second Workshop on Point, Extended, and Surface Defects in Semiconductors, held November 2-7, 1988 in Erice, Italy"--T.p. verso.
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