Point and extended defects in semiconductors / (Record no. 23701)

MARC details
000 -LEADER
fixed length control field 00664nam a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 190917s1989||||xx |||||||||||||| ||und||
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0306433367
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38152
Item number Po
245 #0 - TITLE STATEMENT
Title Point and extended defects in semiconductors /
Statement of responsibility, etc. edited by G. Benedek, A. Cavallini and W. Schroter.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York :
Name of publisher, distributor, etc. Plenum Press,
Date of publication, distribution, etc. c1989.
300 ## - PHYSICAL DESCRIPTION
Extent x, 287 p. :
500 ## - GENERAL NOTE
General note "Proceedings of the NATO advanced research workshop/International School of Materials Science and Technology, Second Workshop on Point, Extended, and Surface Defects in Semiconductors, held November 2-7, 1988 in Erice, Italy"--T.p. verso.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Book
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Shelving location Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
        Dr. B. R. Ambedkar Central Library Dr. B. R. Ambedkar Central Library Science 09/17/2019   621.38152 W89284 Po 153752 09/17/2019 09/17/2019 Book
Untitled Document
Designed & Developed by IT Support | © Dr B R Ambedkar Central Library, JNU, New Delhi 2021