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Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution /

Tsong, Tien Tsou,

Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution / Tien T. Tsong. - Cambridge ; Cambridge University Press, 1990. - x, 387 p. :

ISBN: 0521363799

Subjects--Topical Terms:
Atom-probe field ion microscopy.

Dewey Class. No.: 502.82 / At

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